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Nordson TEST & INSPECTION's 2D and 3D sensors are used in SMT, semiconductor and metrology markets to significantly improve yields and productivity. Proprietary MRS® sensor technology, deemed best-in-class, enables metrology-grade accuracy by inhibiting optical measurement distortions and reflections. At the heart of the world’s cell phone manufacturing inspection systems and used in various applications where highly accurate inspection is critical. Powered by the NEW Ultra-High Resolution 5-Micron Multi-Reflection Suppression (MRS®) Sensor Technology SQ7000+ Multi-Function System with Multi-Reflection Suppression® (MRS®) sensor technology provides the ultimate combination of high resolution, high accuracy and high speed for inspection and metrology. It remains the only system on the market capable of performing AOI, SPI and CMM in-line. The new, ultra-high resolution 5 micron MRS sensor incorporated into the SQ3000+ is specifically designed for advanced applications with the most demanding requirements. Multi-Reflection Suppression® (MRS®) Sensor Technology Multi-Reflection Suppression® (MRS®) Sensor Technology