X-Ray Inspection Systems
The complete solution for operator free, automated X-ray wafer metrology. Nordson XM8000™ is specifically designed for inline use in clean room environments. Nordson's XM8000 Wafer X-ray Metrology Platform is the best x-ray system for advanced semiconductor packaging, CoWoS, TSVs, 2.5 & 3D IC packages as well as wafer bumps.
